John J. Donovan
Director (retired), MicroAnalytical Facility
CAMCOR
University of Oregon
Eugene, OR
Expertise:
Electron Microprobe and Scanning Electron Microscopy
Classes:
GEOL 619 Electron Microprobe Analysis
CH
199 Weird Science
Links:
Golden Software Web
Golden Software User Forum
Probe Software Web
Probe Software User Forum
Background:
Courtesy Staff, Geological Sciences, University of Oregon, 07/2021
Director, MicroAnalytical Facility, CAMCOR, University of
Oregon, 12/2001-06/2021
Laboratory Manager, University of California at Berkeley, 05/1987 -
11/2001
Principal Laboratory Mechanician, Lawrence Berkeley Laboratory,
01/1976 - 04/1987
Publications:
John J Donovan et al., An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in Compounds, Microscopy and Microanalysis, (2023)
John J Donovan and others, A New Method for Dead Time Calibration and a New Expression for Correction of WDS Intensities for Microanalysis, Microscopy and Microanalysis, (2023)
Donovan, John, et al. "Quantitative WDS Compositional Mapping Using the Electron Microprobe." The American Mineralogist (2021).
Donovan, Pinard and Demers, "High Speed Matrix Corrections for Quantitative X-ray Microanalysis Based on Monte Carlo Simulated K-Ratio Intensities", Microscopy & Microanalysis, 25, 735-742, (2019)
Secondary Fluorescence effects in microbeam analysis, Chemical Geology, 490, 22-29, (2018)
Donovan, Singer and Armstrong, "A New EPMA Method for Fast Trace Element Analysis in Simple Matrices", American Mineralogist, v101, p1839-1853, (2016)
Llovet, at. al., "Secondary
fluorescence in electron probe microanalysis of couple
materials", J. Appl. Phys., (2012)
Donovan, et. al., "High Speed
Matrix and Secondary Fluorescence Effects From Fundamental
Parameter Monte Carlo Calculations" (M&M, 2012)
Donovan, et. al., "Improved
electron probe microanalysis of trace elements in
quartz", American Mineralogist, 96, 274282, 2011
Escuder,
et. al., "Numerical Correction for Secondary
Fluorescence Across Phase Boundaries in EPMA", 11th European Workshop on Modern
Developments and Applications in Microbeam Analysis IOP
Publishing IOP Conf. Series: Materials Science and
Engineering 7 (2010) 012008
doi:10.1088/1757-899X/7/1/012008
T.
M. Phung, et. al., "Determination of the Composition of
Ultra-thin Ni-Si films on Si: constrained modeling of
electron probe microanalysis and x-ray reflectivity
data", X-Ray Spectrometery, 2008, v. 37, 608-614
J.
J. Donovan, N. E. Pingitore and A. N. Westphal,
"Composition Averaging of Backscatter Intensities in
Compounds", Microscopy & Microanalysis, 2003, v. 9,
(Reed Comments and Response to Reed)
J.
J. Donovan, N. E. Pingitore and A. N. Westphal,
"Composition Averaging of Backscatter Intensities in
Compounds", Microscopy & Microanalysis, 2003, v. 9,
202-215
J.
J. Donovan and N. E. Pingitore, "Composition Averaging
of Continuum Intensities in Multi-Element Compounds",
Microscopy & Microanalysis, 2002, v. 8, 429-436
J.
J. Donovan and T. N. Tingle, "An Improved Mean Atomic
Number Correction for Quantitative Microanalysis" in
Journal of Microscopy and Microanalysis, v. 2, 1, p. 1-7,
1996
J.
J. Donovan, D. A. Snyder and M. L. Rivers, "An Improved
Interference Correction for Trace Element Analysis"
Microbeam Analysis, 2: 23-28, 1993
Public Presentations:
Springfield Unitarian Church, 05-31-2009
Is
Evolution Just A Theory? (save to disk, then open with
Open Office)
Springfield Unitarian Church, 01-24-2010
Climate
Science: the Good, the Bad and the Ugly (open with
Microsoft PowerPoint)
Science Pub, Cosmic Pizza, 02-11-2010
Weird
Science: Knowledge and Intuition at the Fringe (open with
Microsoft PowerPoint)
IntroDUCKtions, 07-16-2010
Thinking
Critically About Weird Things (open with Microsoft
PowerPoint)
IntroDUCKtions, 07-15-2011
Think
Critically About Weird Things (open with Microsoft
PowerPoint)
Personal:
Awards:
Reading Recommendations:
Contact:
John J. Donovan
CAMCOR, Lokey Laboratory
1443 E. 13th Ave
University of Oregon
Eugene OR 97403-1241
(541) 346-4655 (lab)
E-mail: John Donovan
CAMCOR Home Page
CAMCOR Microanalytical
Facility Home Page
Last Updated 11/25/2023