Published Abstracts and Papers

Contents

• John J Donovan et al., An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in Compounds, Microscopy and Microanalysis, (2023)

• John J Donovan and others, A New Method for Dead Time Calibration and a New Expression for Correction of WDS Intensities for Microanalysis, Microscopy and Microanalysis, (2023)

• Donovan, John, et al. "Quantitative WDS Compositional Mapping Using the Electron Microprobe." The American Mineralogist (2021).

• Donovan, Fellowes and McMorran, "Average Atomic Number and Electron Backscattering in Compounds", Microsc. Microanal. 25 (Suppl 2), 2019
  

• Donovan, Pinard and Demers, "High Speed Matrix Corrections for Quantitative X-ray Microanalysis Based on Monte Carlo Simulated K-Ratio Intensities", Microscopy & Microanalysis, 25, 735-742, (2019)
  
  
• Secondary Fluorescence effects in microbeam analysis, Chemical Geology, 490, 22-29, (2018)

• Donovan, Singer and Armstrong, "A New EPMA Method for Fast Trace Element Analysis in Simple Matrices", American Mineralogist, v101, p1839-1853, (2016)

• Donovan, et al., "High Speed Matrix and Secondary Fluorescence Corrections based on Monte Carlo Calculations" (EMAS, 2013)

• Llovet, et al., "Secondary fluorescence in electron probe microanalysis of couple materials", J. Appl. Phys., (2012)
• Donovan, et al., "High Speed Matrix and Secondary Fluorescence Effects From Fundamental Parameter Monte Carlo Calculations" (M&M, 2012)

• Donovan, et al., "Improved electron probe microanalysis of trace elements in quartz", American Mineralogist, 96, 274­282, 2011

• Escuder, et al., "Numerical Correction for Secondary Fluorescence Across Phase Boundaries in EPMA", 11th European Workshop on Modern Developments and Applications in Microbeam Analysis IOP Publishing IOP Conf. Series: Materials Science and Engineering 7 (2010)

• Phung, et al., "Determination of the Composition Ultra Thin Ni-Si Films" (X-ray Spectrometry, 2008)

• Meisenkothen and Donovan, "Specimen Heterogeneity Analysis: Revisted (M&M, 2008) (Abstract)
• Meisenkothen and Donovan, "Specimen Heterogeneity Analysis: Revisted (M&M, 2008) (Presentation)

• Donovan, et al., "An Iterated Blank Correction for Improved Trace Element Accuracy in EPMA" (M&M, 2007)

• Donovan, "Core Community Specifications for Purchasing and Acceptance of Electron Beam Instruments" (M&M, 2005)
• Donovan and Rowe, "Techniques for Improving Quantitative Analysis of Mineral Glasses" (Goldschmidt, 2005)

• Donovan, and Pingitore, "Compositional Averaging of Continuum Intensities in Multi-Element Compounds" (M&M, 2002)

• Donovan, et al., "Compositional Averaging of Backscatter Intensities in Compounds" (M&M, 2003)
• Donovan, "Compositional Averaging of Backscatter Intensities in Compounds"- Comment by Reed and Response to Reed (M&M, 2003)

• Donovan, et al., "A re-examination of the rare-earth-element orthophosphate standards in use for electron-probe microanalysis:, Cand. Min., 2003.

• Donovan, "Practical Considerations for Mosaic Imaging in Electron Beam Instruments" (Scanning, 1997)
• Donovan and Tingle, "An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis" (Jour. of Micros. Microa, 1996)

• Donovan, et al., "An Improved Interference Correction for Trace Element Analysis" (Microbeam Analysis, 1993)

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Have a question for the laboratory manager? My name is John Donovan. Please feel free to make suggestions to epmalab@uoregon.edu. Or try the lab phone at (541) 346-4655.