John J. Donovan
Director, MicroAnalytical Facility
CAMCOR
University of Oregon
Eugene, OR

Expertise:

Electron Microprobe and Scanning Electron Microscopy


Classes:

GEOL 619 Electron Microprobe Analysis

CH 199 Weird Science

Links:

Golden Software Web

Golden Software User Forum

Probe Software Web

Probe Software User Forum


Background:

Director, MicroAnalytical Facility, CAMCOR, University of Oregon, 12/01-present
Laboratory Manager, University of California at Berkeley, 05/87 - 11/01
Principal Laboratory Mechanician, Lawrence Berkeley Laboratory, 01/76 - 04/87


Publications:

Donovan, Pinard and Demers, "High Speed Matrix Corrections for Quantitative X-ray Microanalysis Based on Monte Carlo Simulated K-Ratio Intensities", Microscopy & Microanalysis, 25, 735-742, (2019)

Secondary Fluorescence effects in microbeam analysis, Chemical Geology, 490, 22-29, (2018)

Donovan, Singer and Armstrong, "A New EPMA Method for Fast Trace Element Analysis in Simple Matrices", American Mineralogist, v101, p1839-1853, (2016)

Llovet, at. al., "Secondary fluorescence in electron probe microanalysis of couple materials", J. Appl. Phys., (2012)

Donovan, et. al., "High Speed Matrix and Secondary Fluorescence Effects From Fundamental Parameter Monte Carlo Calculations" (M&M, 2012)

Donovan, et. al., "Improved electron probe microanalysis of trace elements in quartz", American Mineralogist, 96, 274­282, 2011

Escuder, et. al., "Numerical Correction for Secondary Fluorescence Across Phase Boundaries in EPMA", 11th European Workshop on Modern Developments and Applications in Microbeam Analysis IOP Publishing IOP Conf. Series: Materials Science and Engineering 7 (2010) 012008 doi:10.1088/1757-899X/7/1/012008

T. M. Phung, et. al., "Determination of the Composition of Ultra-thin Ni-Si films on Si: constrained modeling of electron probe microanalysis and x-ray reflectivity data", X-Ray Spectrometery, 2008, v. 37, 608-614

J. J. Donovan, N. E. Pingitore and A. N. Westphal, "Composition Averaging of Backscatter Intensities in Compounds", Microscopy & Microanalysis, 2003, v. 9, (Reed Comments and Response to Reed)

J. J. Donovan, N. E. Pingitore and A. N. Westphal, "Composition Averaging of Backscatter Intensities in Compounds", Microscopy & Microanalysis, 2003, v. 9, 202-215

J. J. Donovan and N. E. Pingitore, "Composition Averaging of Continuum Intensities in Multi-Element Compounds", Microscopy & Microanalysis, 2002, v. 8, 429-436

J. J. Donovan and T. N. Tingle, "An Improved Mean Atomic Number Correction for Quantitative Microanalysis" in Journal of Microscopy and Microanalysis, v. 2, 1, p. 1-7, 1996

J. J. Donovan, D. A. Snyder and M. L. Rivers, "An Improved Interference Correction for Trace Element Analysis" Microbeam Analysis, 2: 23-28, 1993


Public Presentations:

Springfield Unitarian Church, 05-31-2009
Is Evolution Just A Theory? (save to disk, then open with Open Office)

Springfield Unitarian Church, 01-24-2010
Climate Science: the Good, the Bad and the Ugly (open with Microsoft PowerPoint)

Science Pub, Cosmic Pizza, 02-11-2010
Weird Science: Knowledge and Intuition at the Fringe (open with Microsoft PowerPoint)

IntroDUCKtions, 07-16-2010
Thinking Critically About Weird Things (open with Microsoft PowerPoint)

IntroDUCKtions, 07-15-2011
Think Critically About Weird Things (open with Microsoft PowerPoint)


Personal:

Awards:

Reading Recommendations:


Contact:
John J. Donovan
CAMCOR, Lokey Laboratory
1443 E. 13th Ave
University of Oregon
Eugene OR 97403-1241

(541) 346-4632 (office)
(541) 346-4655 (lab)
(541) 346-6854 (FAX)

E-mail: John Donovan

CAMCOR Home Page

CAMCOR Microanalytical Facility Home Page

Last Updated 10/15/18