John J. Donovan
Director (retired), MicroAnalytical Facility
CAMCOR
University of Oregon
Eugene, OR

Expertise:

Electron Microprobe and Scanning Electron Microscopy


Classes:

GEOL 619 Electron Microprobe Analysis

CH 199 Weird Science

Links:

Golden Software Web

Golden Software User Forum

Probe Software Web

Probe Software User Forum


Background:

Courtesy Staff, Geological Sciences, University of Oregon, 07/2021

Director, MicroAnalytical Facility, CAMCOR, University of Oregon, 12/2001-06/2021
Laboratory Manager, University of California at Berkeley, 05/1987 - 11/2001
Principal Laboratory Mechanician, Lawrence Berkeley Laboratory, 01/1976 - 04/1987


Publications:

John J Donovan et al., An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in Compounds, Microscopy and Microanalysis, (2023)

John J Donovan and others, A New Method for Dead Time Calibration and a New Expression for Correction of WDS Intensities for Microanalysis, Microscopy and Microanalysis, (2023)

Donovan, John, et al. "Quantitative WDS Compositional Mapping Using the Electron Microprobe." The American Mineralogist (2021).

Donovan, Pinard and Demers, "High Speed Matrix Corrections for Quantitative X-ray Microanalysis Based on Monte Carlo Simulated K-Ratio Intensities", Microscopy & Microanalysis, 25, 735-742, (2019)

Secondary Fluorescence effects in microbeam analysis, Chemical Geology, 490, 22-29, (2018)

Donovan, Singer and Armstrong, "A New EPMA Method for Fast Trace Element Analysis in Simple Matrices", American Mineralogist, v101, p1839-1853, (2016)

Llovet, at. al., "Secondary fluorescence in electron probe microanalysis of couple materials", J. Appl. Phys., (2012)

Donovan, et. al., "High Speed Matrix and Secondary Fluorescence Effects From Fundamental Parameter Monte Carlo Calculations" (M&M, 2012)

Donovan, et. al., "Improved electron probe microanalysis of trace elements in quartz", American Mineralogist, 96, 274282, 2011

Escuder, et. al., "Numerical Correction for Secondary Fluorescence Across Phase Boundaries in EPMA", 11th European Workshop on Modern Developments and Applications in Microbeam Analysis IOP Publishing IOP Conf. Series: Materials Science and Engineering 7 (2010) 012008 doi:10.1088/1757-899X/7/1/012008

T. M. Phung, et. al., "Determination of the Composition of Ultra-thin Ni-Si films on Si: constrained modeling of electron probe microanalysis and x-ray reflectivity data", X-Ray Spectrometery, 2008, v. 37, 608-614

J. J. Donovan, N. E. Pingitore and A. N. Westphal, "Composition Averaging of Backscatter Intensities in Compounds", Microscopy & Microanalysis, 2003, v. 9, (Reed Comments and Response to Reed)

J. J. Donovan, N. E. Pingitore and A. N. Westphal, "Composition Averaging of Backscatter Intensities in Compounds", Microscopy & Microanalysis, 2003, v. 9, 202-215

J. J. Donovan and N. E. Pingitore, "Composition Averaging of Continuum Intensities in Multi-Element Compounds", Microscopy & Microanalysis, 2002, v. 8, 429-436

J. J. Donovan and T. N. Tingle, "An Improved Mean Atomic Number Correction for Quantitative Microanalysis" in Journal of Microscopy and Microanalysis, v. 2, 1, p. 1-7, 1996

J. J. Donovan, D. A. Snyder and M. L. Rivers, "An Improved Interference Correction for Trace Element Analysis" Microbeam Analysis, 2: 23-28, 1993


Public Presentations:

Springfield Unitarian Church, 05-31-2009
Is Evolution Just A Theory? (save to disk, then open with Open Office)

Springfield Unitarian Church, 01-24-2010
Climate Science: the Good, the Bad and the Ugly (open with Microsoft PowerPoint)

Science Pub, Cosmic Pizza, 02-11-2010
Weird Science: Knowledge and Intuition at the Fringe (open with Microsoft PowerPoint)

IntroDUCKtions, 07-16-2010
Thinking Critically About Weird Things (open with Microsoft PowerPoint)

IntroDUCKtions, 07-15-2011
Think Critically About Weird Things (open with Microsoft PowerPoint)


Personal:

Awards:

Reading Recommendations:


Contact:
John J. Donovan
CAMCOR, Lokey Laboratory
1443 E. 13th Ave
University of Oregon
Eugene OR 97403-1241

(541) 346-4655 (lab)
E-mail: John Donovan

CAMCOR Home Page

CAMCOR Microanalytical Facility Home Page

Last Updated 11/25/2023