Reports and Notes

The following are short reports and notes concerning issues in electron probe micro analysis. Contact John Donovan if you have any questions (541) 346-4632.

• APF (Area Peak Factor) Measurements on SiO2 and Al2O3 relative to MgO (or Bastin's Fe2O3)
• SRM 2135C Thin Film Standard Quantitative Report
• Sulfur Peak Shift Effect on Quantitation Study in VG-2 Glass
• Thin Film References
• K-ratio and ZAF Glossary
• High Order Refraction Bragg Correction Study
• Comparison of Th and Zr synthetic Materials Grown by John Hanchar
• U Ma and Ar Absorption Edge Notes
• Mg Ka Spectrometer Drift Study
• Si Ka Spectrometer Drift Study
• Oxygen "Density" in Oxide Materials (a speculation)
• Mercury in Commercial Plastic Study
• Study of Trace Analysis of Phosphorus in Zircon (large overlap issue)

• Trace Element Analysis in Rutile (effect of various corrections on analytical sensitivity error calculations)
• Ti and Zr Analytical Errors in Quartz and Rutile
• Si-SiO2 Nano-Particles and Correcting for Si Ka Peak Shift using Normalized APFs
• Background Measurement Comparison, Off-Peak vs. MAN vs. Nth Point
• Ti in Quartz Statistics Spreadsheet Results (standard deviations, detection limits)

Documents regarding "Water by Difference and Volatile Element matrix Effects

• "Missing Water" in Zeolites GSA Abstract (Tingle, et. al.)
• Improving Glass Analyses (Goldschmidt, 2005, full presentation)
• SiO2 glass and quartz beam damage comparison (excerpt from Goldschmidt, 2005)
• "Water by Difference" Matrix Effects in glass (and volatile element correction, excerpt from Goldschmidt, 2005)
• Wither's Glasses (water by stoichiometric to excess oxygen)

Recent documents

• Preliminary work on MgB2 and MgB4 New!
• Measuring Na in the Presence of Zn (Zn Lb1 interference on Na ka) New!
• Empirical Determination of O Ka MACs in V2O3 and V2O5 New!
• Secondary Boundary Fluorescence of Ti Ka in SiO2 New and Astonishing!